-
MechanicalProperties CeramicCapacitor Gallium SAM GaN cannabis EPFL MagneticForce solar_cell ContactMode AAO SelfAssembly SrTiO3 Pzt Optical layers Polyimide DataStorage Copper #EC Annealed plastic InsulatorFilm SKKU Filter OpticalElement ShenYang MoirePattern CVD Layer HardDiskMedia LiquidCrystal fe_nd_b Roughness Morphology
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256