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Chungnam_National_University PolymerPatterns small_scan Composite Korea Au111 SolarCell ForceVolumeImage OpticalElement TransitionMetal Implant SPMLabs OrganicCompound Molybdenum temperature_control PhthalocyaninePraseodymium Organic CNT single_layer TungstenThinFilmDeposition Sio2 KPFM hetero_structure high_resolution NtuEee temp_control Bacterium Melt Lattice rubber ChemicalCompound Wildtype self_assembly graphene_hybrid HexagonalBN
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WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm