-
MeltingPoint Aggregated_molecules Nanotechnology STM high_resolution Leakage PtfeFilter BCZT Typhimurium Genetic OxideLayer SelfAssembly nanomechanical silicon_carbide Silver TyphimuriumBiofilm Beads OrganicSemiconductor Cross-section Mfm LiBattery ElectroDeposition temp_control vertical_PFM Corrosion MagneticForceMicroscopy Trench Wafer OpticalWaveguides Sulfur TappingMode Switching C_AFM Celebration Conductance
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Suspended silicon nitride membrance
Scanning Conditions
- System : NX20
- Scan Mode: Tapping
- Scan Rate : 0.2 Hz
- Scan Size : 75μm×75μm
- Pixel Size : 256×256
- Cantilever : TESPA-V2 (k=37N/m, f=320kHz)