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ConductingPolymer PolyvinylideneFluoride I-VSpectroscopy CalciumHydroxyapatite Oxide temperature_control TungstenDeposition GlassTemperature dichalcogenide HexagonalBN Inorganic NusEce IVSpectroscopy LDPE Semiconductor PS_LDPE CuParticle Aggregated_molecules Tapping Filter LateralForceMicroscopy PFM Beads kelvin probe force microscopy Dopped Wonseok blended polymers Wang LFM PDMS MetalCompound Glass Pinpoint PFM frequency_modulation BTO
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2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)