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WWafer bias_mode Solution MagneticPhase piezoelectric force microscopy CntFilm ring shape IVSpectroscopy AdhesionEnergy NiFe Polarization ItoGlass IndiumTinOxide LiIonBattery Change DeoxyribonucleicAcid DOE Force-distance Polyimide Polypropylene Sapphire heterojunctions Grain Sulfur ConductingPolymer mono_layer LightEmission Nanotechnology PolymerPatterns Modulus MESA structure OpticalElement cross section MoirePattern semifluorinated alkane
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Block copolymer phase change by temp
Scanning Conditions
- System: NX10
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256
- Scan Mode: Tapping,TCS2
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×256