-
ForceMapping SFAs PVA Gallium_Arsenide Wafer Filter TemperatureControllerStage Magnets TipBiasMode Cobalt-dopedIronOxide ForceVolumeMapping UnivCollegeLondon SThM ScanningSpreadingResistanceMicroscopy Hafnium_dioxide HafniumDioxide Pipette Polytetrafluoroethylene Conductivity gallium_nitride Implant SiliconeOxide high_resolution CP-AFM GalliumPhosphide P3HT Chromium LateralForce SKPM Magnetic Force Microscopy Workfunction Dimethicone Electrode MoS2 rubber
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)