-
Vanadate Ram KelvinProbeForceMicroscopy SmalScan flakes Varistor VerticalPFM DeflectionOptics CopperFoil NCM\ Hair fluoroalkane BiFeO3 Mechinical HydroGel PhthalocyaninePraseodymium Permalloy Yeditepe TappingMode Dental StainlessSteel Film FailureAnlaysis Kevlar HighAspect LiNbO3 Alkane Scratch Litho Yttria_stabilized_Zirconia Switching SiliconeOxide DentalProsthesis Epoxy molecular_beam
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V