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Annealed LiquidCrystal PolyStylene LiftMode TPU Fluoride IRDetector ContactModeDot layers optoelectronics OpticalElement OxideLayer Leakage Calcium nanomechanical PANI semifluorinated_alkanes Morphology CastIron Phthalocyanine atomic_layer Reduction 2d_materials FM_SKPM #Materials Piezo GaP KelvinProbeForceMicroscopy Magnetic Force Microscopy Moire ConductiveAFM AtomicLayer LiftHeight Gallium ImideMonomer
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STO(SrTiO3), Annealed LAO(LaAlO3)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm, 5μm×5μm
- Scan Rate: 0.8Hz, .9Hz
- Pixel: 512×512, 256×256