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PS_LDPE HexagonalBoronNitride FrictionalForceMicroscopy layers Lateral_Force_Microscopy Polytetrafluoroethylene IRDetector UnivMaryland PolycrystallineFerroelectricBCZT Non-ContactMode MeltingPoint Indent Fet CrAu GranadaUniv OrganicCompound AM_SKPM BaTiO3 KAIST Polyurethane HighAcpectRatio hard_disk_media GaAs NanoLithography fifber Monisha AM_KPFM Mobile tip_bias_mode thermoplastic_elastomers Magnetic Force Microscopy SICM PvdfFilm SSRM Ito
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V