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AEAPDES AdhesionEnergy Polymer ferromagnetic Etch SiliconOxide semifluorinated_alkane dielectric_trench gallium_nitride Moire TemperatureControllerAFM HiVacuum Vanadate ito_film Cancer temp_control CeramicCapacitor fluoroaalkane Alkane SKKU MetalCompound AlkaneFilm BoronNitride Polytetrafluoroethylene SmalScan 2dMaterials C60H122 Gallium_Arsenide FailureAnlaysis pinpoint mode Microchannel PpLdpe Chrome DomainSwitching LeakageCurrent
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MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256