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Morphology Hysteresys PUR Workfunction molecular_beam EPFL Hafnium_dioxide Lift NUSNNI CrAu silicon_oxide PMNPT PhaseImaging HexagonalBN Wafer MembraneFilter FM-KPFM Pyroelectric Stiffness HBN Indium_tin_oxide Christmas oxide_layer CuFoil PS_PVAC hydrocarbon hetero_structure AtomicLayer SiliconCrystal Mfm Scanning_Thermal_Microscopy Al2O3 Annealing Neodymium SThM
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Triple-cation perovskite
Scanning Conditions
- System : NX10
- Sample bias: 0 V, 0.5 V
- Scan Mode: C-AFM with PCM toolkit
- Scan Rate : 0.25 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : ANSCM-PC (k=0.2N/m, f=12kHz)