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Lateral Mosfet Nanofiber STO Wildtype oxide_layer GaN Mechanical pinpoint mode polymeric_arrays AdhesionEnergy Patterns MBE CompactDisk Fe_film alkanes FM-KPFM Typhimurium Global_Comm food Photovoltaics SFAs dichalcogenide PhaseImaging Change Domain Ferrite CaMnO3 MoirePattern Varistor PetruPoni_Institute CP-AFM layers Ceramic Resistance
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PS/LDPE
Scanning Conditions
- System : FX40
- Scan Mode: PinPoint nanomechanical
- Scan Rate : 0.15 Hz
- Scan Size : 50μm×50μm
- Pixel Size : 256×256
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)