-
NUSNNI Granada Laser domain_switching Strontium TempControl HanyangUniv YttriaStabilizedZirconia HBN HafniumDioxide Platinum temperature_control GaP mfm_amplitude SiliconeOxide alkanes LithiumNiobate Dopped ScanningThermalMicroscopy Friction Holes Yeditepe PhthalocyaninePraseodymium MolybdenumDisulfide HDD Scanning_Thermal_Microscopy NCM\ IIT-chennai Workfunction Glass FailureAnalysis Zhi FAFailureAnlaysis Mechanical ContactModeDot
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126