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TPU IMT_Bucharest semifluorinated_alkane INSPParis CrystalGrowing NUSNNI GalliumPhosphide ito_film Glass Regensburg TiO2 Lattice Current CrossSection Corrosion Step Photovoltaics PolycrystallineFerroelectricBCZT YttriaStabilizedZirconia Vanadate Permalloy 3-hexylthiophene high_resolution SiliconOxide Lift MagneticForceMicroscopy doped Fendb HafniumDioxide semifluorinated_alkanes multi_layer BiasMode LiNbO3 Chromium ChemicalCompound
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MoS2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256