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FailureAnalysis SiliconOxide GalliumPhosphide NusEce Global_Comm IISCBangalore Electical&Electronics StrontiuTitanate ThermalDetectors semifluorinated_alkane Ca10(PO4)6(OH)2 HafniumDioxide Melt SurfaceChange Fendb Formamidinium_lead_iodide LateralForce MagneticArray Forevision light_emitting membrane FM-KPFM Austenite Adhesion 2-vinylpyridine AAO Stiffness Sic Reduction WWafer cross section plastic Subhajjit thermal_conductivity SiWafer
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Adhesive system
Scanning Conditions
- System: NX10
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256
- Scan Mode: PinPoint
- Cantilever: ACST (k=7N/m, f=150kHz)
- Scan Size: 30μm×30μm, 20μm×20μm
- Scan Rate: 0.23Hz
- Pixel: 256×256