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C36H74 OpticalElement Fluoride Ananth ContactMode Reduction CrAu Layer oxide_layer Floppy Subhajjit Hole Lateral CalciumHydroxyapatite Calcium TPU Regensburg ForceVolume SrTiO3 LiftHeight PhaseTransition EFM ferromagnetic Device Tin sulfide Defects Indium_tin_oxide Christmas Formamidinium_lead_iodide LateralForce kelvin probe force microscopy GranadaUniv Pores tip_bias_mode NCM
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Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256