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light_emission BTO Annealing NUSNNI Tungsten_disulfide Fluoride PiezoelectricForceMicroscopy Conductive AFM Kevlar UnivOfMaryland Nickel self-assembly DOE fluorocarbon Celebration Mosfet Chromium PhaseTransition Treatment NusEce Workfunction conductive ScanningThermalMicroscopy ThermalConductivity NCM\ DNA Spincast Polytetrafluoroethylene Lift PMNPT Cobalt-dopedIronOxide Lateral AdhesionEnergy gallium_nitride Aluminum
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Perovskite coated on glass with Palladium electrodes
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : All 0.4 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 256×256
- Cantilever : NSC36 Pt C(k=0.6N/m, f=65kHz)