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Optic Metal frequency_modulation Indium_tin_oxide MonoLayer PyroelectricDetector SRAM Leakage Mfm Ni-FeAlloy LFM BismuthFerrite Phosphide Mechanical Stiffness Fendb AnodizedAluminumOxide VinylAlcohol Defect Galfenol Edwin dielectric_trench VerticalPFM ItoGlass MolybdenumDisulfide Protein BFO InsulatorFilm ContactModeDots Regensburg HighResolution Granada Lateral_Force_Microscopy Titanate GalliumPhosphide
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Suspended silicon nitride membrance
Scanning Conditions
- System : NX20
- Scan Mode: Tapping
- Scan Rate : 0.2 Hz
- Scan Size : 75μm×75μm
- Pixel Size : 256×256
- Cantilever : TESPA-V2 (k=37N/m, f=320kHz)