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Cobalt Molybdenum dielectric_trench PtfeFilter Hafnium_dioxide Edwin lift_mode Scanning_Thermal_Microscopy temp_control fluoroalkane hetero_structure Vac non_contact BlockCopolymer Tungsten_disulfide UnivMaryland VerticalPFM Oxidation nanomechanical EFM margarine Ca10(PO4)6(OH)2 Lateral BiasMode Nanostructure Aluminium_Oxide AAO HOPG organic_polymer LiBattery PinpointPFM semifluorinated alkane SelfAssembly Subhajjit Magnetic Force Microscopy
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ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512